{"title":"基于测量s参数的微波电路时频分析降阶模型","authors":"J.M. Gomez, B. Gómez, M. Ruipérez, J. Alonso","doi":"10.1109/EPEP.2001.967639","DOIUrl":null,"url":null,"abstract":"An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reduced-order models based on measured S-parameters for time-frequency analysis of microwave circuits using genetic algorithms\",\"authors\":\"J.M. Gomez, B. Gómez, M. Ruipérez, J. Alonso\",\"doi\":\"10.1109/EPEP.2001.967639\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.\",\"PeriodicalId\":174339,\"journal\":{\"name\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2001.967639\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967639","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reduced-order models based on measured S-parameters for time-frequency analysis of microwave circuits using genetic algorithms
An efficient technique is developed to characterize the time-frequency domain behavior of microwave and RF devices characterized by its S-parameters, by means of the implementation of reduced-order models, expressed in terms of rational polynomials, into a general time domain simulator. The use of a genetics algorithm guarantees the smallest model order.