各向异性基片上FSS的赫兹矢量电位分析

Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678) Pub Date : 2003-11-17 DOI:10.1109/IMOC.2003.1244906

A. Campos, A. D’assunção

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引用次数: 9

摘要

本文提出了各向异性介质层上频率选择表面(FSS)的并矢格林函数的解析测定方法。所分析的结构由导电贴片元件的周期性阵列组成。将矩量法与赫兹矢量势法相结合，得到了反射功率的计算结果。假设各向异性衬底中的光轴沿FSS导片阵列主轴方向，反射功率随频率的变化曲线为结构参数的函数。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Hertz vector potential analysis of FSS on anisotropic substrates

This work presents an analytical determination of the dyadic Green's function for frequency selective surfaces (FSS) on anisotropic dielectric layers. The structure analyzed is composed of a periodic array of conducting patch elements. Results are obtained for the reflected power by using the moment method combined with the Hertz vector potential method. Curves for the reflected power versus frequency are presented as a function of the structural parameters, assuming that the optical axis in the anisotropic substrate is oriented along the FSS conducting patch array main axes.

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来源期刊

Proceedings of the 2003 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference - IMOC 2003. (Cat. No.03TH8678)

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