一种基于vhdl的数字CMOS电路漏功率精确估计技术

A. Nourivand, Chunyan Wang, M. Ahmad
{"title":"一种基于vhdl的数字CMOS电路漏功率精确估计技术","authors":"A. Nourivand, Chunyan Wang, M. Ahmad","doi":"10.1109/NEWCAS.2005.1496694","DOIUrl":null,"url":null,"abstract":"Accurate modeling and estimating of the leakage power dissipation in the early stages of the design flow is becoming more important, as the aggressive scaling of transistors results in higher leakage currents. In this work, we present a VHDL-based technique to estimate an accurate leakage power of a design considering the state-dependency of the leakage power. We develop the VHDL models of cells which trace the probability of the static levels of the signals in the course of a simulation. Then, these data are used to calculate the leakage power in the overall design. The leakage power of some benchmark circuits is estimated using the proposed approach and the results are compared with those obtained from SPICE simulation, in order to illustrate the viability of the proposed technique. It is shown that the values of the leakage power obtained by the proposed technique are comparable to those obtained by SPICE, with a reduction of about three orders of magnitude in the simulation time.","PeriodicalId":131387,"journal":{"name":"The 3rd International IEEE-NEWCAS Conference, 2005.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A VHDL-based technique for an accurate estimation of leakage power in digital CMOS circuits\",\"authors\":\"A. Nourivand, Chunyan Wang, M. Ahmad\",\"doi\":\"10.1109/NEWCAS.2005.1496694\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Accurate modeling and estimating of the leakage power dissipation in the early stages of the design flow is becoming more important, as the aggressive scaling of transistors results in higher leakage currents. In this work, we present a VHDL-based technique to estimate an accurate leakage power of a design considering the state-dependency of the leakage power. We develop the VHDL models of cells which trace the probability of the static levels of the signals in the course of a simulation. Then, these data are used to calculate the leakage power in the overall design. The leakage power of some benchmark circuits is estimated using the proposed approach and the results are compared with those obtained from SPICE simulation, in order to illustrate the viability of the proposed technique. It is shown that the values of the leakage power obtained by the proposed technique are comparable to those obtained by SPICE, with a reduction of about three orders of magnitude in the simulation time.\",\"PeriodicalId\":131387,\"journal\":{\"name\":\"The 3rd International IEEE-NEWCAS Conference, 2005.\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 3rd International IEEE-NEWCAS Conference, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS.2005.1496694\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 3rd International IEEE-NEWCAS Conference, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2005.1496694","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

在设计流程的早期阶段,准确建模和估计泄漏功耗变得越来越重要,因为晶体管的积极缩放导致更高的泄漏电流。在这项工作中,我们提出了一种基于vhdl的技术来估计泄漏功率的精确设计,考虑泄漏功率的状态依赖性。我们开发了细胞的VHDL模型,在模拟过程中跟踪信号的静态水平的概率。然后,利用这些数据计算总体设计中的泄漏功率。利用该方法估计了一些基准电路的泄漏功率,并与SPICE仿真结果进行了比较,以说明该方法的可行性。结果表明,该方法得到的泄漏功率值与SPICE方法得到的泄漏功率值相当,在模拟时间上降低了约3个数量级。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A VHDL-based technique for an accurate estimation of leakage power in digital CMOS circuits
Accurate modeling and estimating of the leakage power dissipation in the early stages of the design flow is becoming more important, as the aggressive scaling of transistors results in higher leakage currents. In this work, we present a VHDL-based technique to estimate an accurate leakage power of a design considering the state-dependency of the leakage power. We develop the VHDL models of cells which trace the probability of the static levels of the signals in the course of a simulation. Then, these data are used to calculate the leakage power in the overall design. The leakage power of some benchmark circuits is estimated using the proposed approach and the results are compared with those obtained from SPICE simulation, in order to illustrate the viability of the proposed technique. It is shown that the values of the leakage power obtained by the proposed technique are comparable to those obtained by SPICE, with a reduction of about three orders of magnitude in the simulation time.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信