{"title":"创新以克服测试设备的局限性","authors":"C. Wegener, Michael Peter Kennedy","doi":"10.1109/ECCTD.2005.1522972","DOIUrl":null,"url":null,"abstract":"In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.","PeriodicalId":266120,"journal":{"name":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Innovation to overcome limitations of test equipment\",\"authors\":\"C. Wegener, Michael Peter Kennedy\",\"doi\":\"10.1109/ECCTD.2005.1522972\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.\",\"PeriodicalId\":266120,\"journal\":{\"name\":\"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2005.1522972\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2005.1522972","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Innovation to overcome limitations of test equipment
In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.