{"title":"有效的依赖于在制品的批放行政策:离散事件模拟方法","authors":"Raha Akhavan-Tabatabaei, Carlos F. Ruiz Salazar","doi":"10.1109/WSC.2011.6147911","DOIUrl":null,"url":null,"abstract":"In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.","PeriodicalId":246140,"journal":{"name":"Proceedings of the 2011 Winter Simulation Conference (WSC)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Effective WIP dependent lot release policies: A discrete event simulation approach\",\"authors\":\"Raha Akhavan-Tabatabaei, Carlos F. Ruiz Salazar\",\"doi\":\"10.1109/WSC.2011.6147911\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.\",\"PeriodicalId\":246140,\"journal\":{\"name\":\"Proceedings of the 2011 Winter Simulation Conference (WSC)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2011 Winter Simulation Conference (WSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WSC.2011.6147911\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2011 Winter Simulation Conference (WSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WSC.2011.6147911","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effective WIP dependent lot release policies: A discrete event simulation approach
In this paper we explore a lot release policy for wafer fabs that is based on the WIP threshold of the bottleneck station. Our results show that this policy is effective in cycle time improvement while keeping the same level of throughput compared with a case where no policy is applied. The application of this policy is practical and needs less considerations compared to policies that aim at keeping the WIP constant throughout the fab.