{"title":"单次扫描事件相关电位的变步长最小均方估计","authors":"M. Benkherrat, Radouane Bouguerra, T. Choufa","doi":"10.1109/ICELIE.2006.347188","DOIUrl":null,"url":null,"abstract":"Method for improving the signal-to-noise ratio of event related potentials (ERP) measurements is presented .The method is based on adaptive Fourier model. The Fourier model is based on the VSSLMS algorithm. A reduced number of single ERP trials being used for estimating the average response. The performance of the method is evaluated with simulations and real measurements of the ERP responses and compared to the ensemble averaging method","PeriodicalId":345289,"journal":{"name":"2006 1ST IEEE International Conference on E-Learning in Industrial Electronics","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Variable Step Size Least Mean Square Estimator for Single-Sweep Event Related Potentials\",\"authors\":\"M. Benkherrat, Radouane Bouguerra, T. Choufa\",\"doi\":\"10.1109/ICELIE.2006.347188\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Method for improving the signal-to-noise ratio of event related potentials (ERP) measurements is presented .The method is based on adaptive Fourier model. The Fourier model is based on the VSSLMS algorithm. A reduced number of single ERP trials being used for estimating the average response. The performance of the method is evaluated with simulations and real measurements of the ERP responses and compared to the ensemble averaging method\",\"PeriodicalId\":345289,\"journal\":{\"name\":\"2006 1ST IEEE International Conference on E-Learning in Industrial Electronics\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 1ST IEEE International Conference on E-Learning in Industrial Electronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICELIE.2006.347188\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 1ST IEEE International Conference on E-Learning in Industrial Electronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICELIE.2006.347188","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Variable Step Size Least Mean Square Estimator for Single-Sweep Event Related Potentials
Method for improving the signal-to-noise ratio of event related potentials (ERP) measurements is presented .The method is based on adaptive Fourier model. The Fourier model is based on the VSSLMS algorithm. A reduced number of single ERP trials being used for estimating the average response. The performance of the method is evaluated with simulations and real measurements of the ERP responses and compared to the ensemble averaging method