adolt -一种适用于VLSI电路的在线测试方案

A. Maamar, G. Russell
{"title":"adolt -一种适用于VLSI电路的在线测试方案","authors":"A. Maamar, G. Russell","doi":"10.1145/307418.307473","DOIUrl":null,"url":null,"abstract":"ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits\",\"authors\":\"A. Maamar, G. Russell\",\"doi\":\"10.1145/307418.307473\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.\",\"PeriodicalId\":442382,\"journal\":{\"name\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/307418.307473\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307473","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

ADOLT允许对CED方案的错误检测能力进行调整,以适应应用程序的错误检测需求。这减少了方案对设计的影响,包括面积开销和对性能的影响。该方案使用Dong的代码[1982]的一个稍微修改的版本,并且给出比以前的方法更有效的实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits
ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.
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