{"title":"adolt -一种适用于VLSI电路的在线测试方案","authors":"A. Maamar, G. Russell","doi":"10.1145/307418.307473","DOIUrl":null,"url":null,"abstract":"ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.","PeriodicalId":442382,"journal":{"name":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits\",\"authors\":\"A. Maamar, G. Russell\",\"doi\":\"10.1145/307418.307473\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.\",\"PeriodicalId\":442382,\"journal\":{\"name\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/307418.307473\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/307418.307473","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits
ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of area overheads and the effect on performance. The scheme uses a slightly modified version of Dong's code [1982] and gives a more efficient implementation than previous methods.