用于4½的双极单片模拟子系统;数字A/D转换器

K. Hareyama, K. Yoshimura, K. Murase
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引用次数: 1

摘要

在微处理器和数字万用表的数据处理系统中,需要高精度的A/D转换器。为了响应这一最新需求,CMOS单片结构与双斜率技术“7”相结合已被广泛应用。然而,CMOS工艺限制了a (D)转换器3%数字的分辨率。另一方面,在双斜率技术中,在模拟子系统和数字子系统之间构建了一个反馈回路。这种安排降低了两个系统之间的电气隔离。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A bipolar monolithic analog subsystem for a 4½ digit A/D converter
A HIGHLY ACCURATE A/D convcrter has been required in data handling systems for a microprocessor and in digital multimeters. Responding to this recent demand, a CMOS monolithic structure has been widely employed in combination with the dual slope technique’ 7’. The CMOS process, however, places a limitation on the resolution of an A(D converter at 3% digits. In the dual slope technique, on the other hand, a feedback loop is constructed between the analog and the digital subsystems. This arrangement degrades the electrical isolation between the two systems.
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