基于fpga的容错系统重构控制器可靠性分析

R. Panek, Jakub Lojda, Jakub Podivinsky, Z. Kotásek
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引用次数: 2

摘要

本文讨论了可作为容错控制系统组成部分的重构控制器的可靠性分析。该控制器是为FPGA设计的,能够使用FPGA的部分动态重新配置来减轻FPGA配置内存中的潜在故障。这些故障被称为seu,可由辐射效应引起。因此,容错测量或估计对于关键环境下的电路设计非常重要。因此,重构控制器本身的可靠性是非常重要的;因此,采用容错估计(FT-EST)框架进行可靠性评估,通过发现一些关键配置位来获得可靠性评估。使用并比较了两种方法:仅对使用的LUT求值,以及对所有配置位求值。我们确定,以发现的关键配置位的数量成比例减少为代价,将时间消耗减少了20倍。所得结果几乎相等。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reliability Analysis of Reconfiguration Controller for FPGA–Based Fault Tolerant Systems: Case Study
This paper deals with a reliability analysis of a reconfiguration controller which can be a component of a faulttolerant control system. This controller is designed for an FPGA to be capable of using partial dynamic reconfiguration of the FPGA to mitigate potential faults in the FPGA’s configuration memory. These faults, which are called SEUs, can be induced by radiation effects. Therefore, fault tolerance measurement or estimation is very important for designing circuits for critical environments. Thus, the reliability of the reconfiguration controller itself is significant; therefore the Fault Tolerance ESTimation (FT-EST) framework is used for reliability evaluation, which is procured by the discovery of a number of critical configuration bits. Two approaches are used and compared: evaluations of used LUT only, and evaluations of all configuration bits. We ascertained a 20x reduction in time consumption at the expense of a proportional decrease in the amount of critical configuration bits discovered. The obtained results are nearly equivalent.
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