半导体微结构非平衡过程的图解技术

G. Zebrev
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引用次数: 0

摘要

亚微米半导体器件的发展要求对微观结构中的非平衡现象有一个清晰而全面的描述。为了描述这些新的亚微米结构中的电子输运,在许多情况下,我们不能诉诸经典的玻尔兹曼描述,而必须包括电子输运的量子力学方面。在时间可逆的电子态薛定谔方程中,电子态在时间演化过程中不改变其本征能。因此,这是一种纯粹的状态描述,不能处理电子-声子和电子-电子相互作用。由于动力学过程的统计性质,薛定谔方程的一个确定的守恒哈密顿量不能被指定,量子器件应该被认为是一个统计系统,其特征是密度矩阵或格林函数。这项工作的目标是在规范不变性的一般原理的基础上发展这种方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A diagram technique for nonequilibrium processes in semiconductor microstructures
The development of submicron semiconductor devices demands a clear and general description of nonequilibrium phenomena in micro structures. To describe electronic transport in these new submicron structures, in many cases we cannot resort to a classical Boltzmann description but must include the quantum-mechanical aspects of electronic transport. In the time-reversible Schroedinger equation for an electron state, the state does not change its eigenenergy during its temporal evolution. Accordingly, this is a pure state description, which cannot treat electron-phonon and electron-electron interaction. Due to the statistical nature of kinetic processes, a definite conserved Hamiltonian for the Schroedinger equation cannot be specified and quantum device should be considered as a statistical system, characterized by the density matrix or Green's function. The objective of this work is to develop such based on general principles of gauge invariance.
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