J. Noel, Manuel Pezzin, J. Christmann, Lorenzo Ciampolini, Mikael Le Coadou, Mariam Diallo, Florent Lepin, Benjamin Blampey, Simone Bacles-Min, Romain Wacquez, Mikael Le
{"title":"一种保护存储在安全ram中的敏感数据的近瞬时非侵入性擦除设计技术","authors":"J. Noel, Manuel Pezzin, J. Christmann, Lorenzo Ciampolini, Mikael Le Coadou, Mariam Diallo, Florent Lepin, Benjamin Blampey, Simone Bacles-Min, Romain Wacquez, Mikael Le","doi":"10.1109/ESSCIRC53450.2021.9567885","DOIUrl":null,"url":null,"abstract":"On-chip memories, and in particular SRAMs, are among the most critical components in terms of data security because they might contain sensitive data such as secret keys. Whenever a tampering event is detected, one should be able to erase efficiently and rapidly the full content of a memory holding such sensitive data, but current solutions based on simple power-off lead to very long erasure times. In this paper, we present a non-invasive design technique based on an innovative mechanism to remove electric charges from SRAM bitcells still powered on, before refreshing them with a new content not correlated with the previous one. The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). The use of the latter drops the ratio of zeroized addresses at 92 %, while increasing the operating energy consumption by 2.1x under nominal operating conditions.","PeriodicalId":129785,"journal":{"name":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Near-Instantaneous and Non-Invasive Erasure Design Technique to Protect Sensitive Data Stored in Secure SRAMs\",\"authors\":\"J. Noel, Manuel Pezzin, J. 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The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). 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A Near-Instantaneous and Non-Invasive Erasure Design Technique to Protect Sensitive Data Stored in Secure SRAMs
On-chip memories, and in particular SRAMs, are among the most critical components in terms of data security because they might contain sensitive data such as secret keys. Whenever a tampering event is detected, one should be able to erase efficiently and rapidly the full content of a memory holding such sensitive data, but current solutions based on simple power-off lead to very long erasure times. In this paper, we present a non-invasive design technique based on an innovative mechanism to remove electric charges from SRAM bitcells still powered on, before refreshing them with a new content not correlated with the previous one. The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). The use of the latter drops the ratio of zeroized addresses at 92 %, while increasing the operating energy consumption by 2.1x under nominal operating conditions.