一种保护存储在安全ram中的敏感数据的近瞬时非侵入性擦除设计技术

J. Noel, Manuel Pezzin, J. Christmann, Lorenzo Ciampolini, Mikael Le Coadou, Mariam Diallo, Florent Lepin, Benjamin Blampey, Simone Bacles-Min, Romain Wacquez, Mikael Le
{"title":"一种保护存储在安全ram中的敏感数据的近瞬时非侵入性擦除设计技术","authors":"J. Noel, Manuel Pezzin, J. Christmann, Lorenzo Ciampolini, Mikael Le Coadou, Mariam Diallo, Florent Lepin, Benjamin Blampey, Simone Bacles-Min, Romain Wacquez, Mikael Le","doi":"10.1109/ESSCIRC53450.2021.9567885","DOIUrl":null,"url":null,"abstract":"On-chip memories, and in particular SRAMs, are among the most critical components in terms of data security because they might contain sensitive data such as secret keys. Whenever a tampering event is detected, one should be able to erase efficiently and rapidly the full content of a memory holding such sensitive data, but current solutions based on simple power-off lead to very long erasure times. In this paper, we present a non-invasive design technique based on an innovative mechanism to remove electric charges from SRAM bitcells still powered on, before refreshing them with a new content not correlated with the previous one. The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). The use of the latter drops the ratio of zeroized addresses at 92 %, while increasing the operating energy consumption by 2.1x under nominal operating conditions.","PeriodicalId":129785,"journal":{"name":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Near-Instantaneous and Non-Invasive Erasure Design Technique to Protect Sensitive Data Stored in Secure SRAMs\",\"authors\":\"J. Noel, Manuel Pezzin, J. Christmann, Lorenzo Ciampolini, Mikael Le Coadou, Mariam Diallo, Florent Lepin, Benjamin Blampey, Simone Bacles-Min, Romain Wacquez, Mikael Le\",\"doi\":\"10.1109/ESSCIRC53450.2021.9567885\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"On-chip memories, and in particular SRAMs, are among the most critical components in terms of data security because they might contain sensitive data such as secret keys. Whenever a tampering event is detected, one should be able to erase efficiently and rapidly the full content of a memory holding such sensitive data, but current solutions based on simple power-off lead to very long erasure times. In this paper, we present a non-invasive design technique based on an innovative mechanism to remove electric charges from SRAM bitcells still powered on, before refreshing them with a new content not correlated with the previous one. The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). The use of the latter drops the ratio of zeroized addresses at 92 %, while increasing the operating energy consumption by 2.1x under nominal operating conditions.\",\"PeriodicalId\":129785,\"journal\":{\"name\":\"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)\",\"volume\":\"122 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC53450.2021.9567885\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC53450.2021.9567885","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

片上存储器,特别是sram,是数据安全方面最关键的组件之一,因为它们可能包含诸如密钥之类的敏感数据。无论何时检测到篡改事件,都应该能够高效、快速地擦除保存此类敏感数据的内存的全部内容,但是当前基于简单断电的解决方案导致擦除时间非常长。在本文中,我们提出了一种基于创新机制的非侵入性设计技术,在使用与前一个不相关的新内容刷新之前,从仍然通电的SRAM位单元中去除电荷。这种新型硬件对策的特点是能够与任何由推规则代工位单元设计的SRAM电路兼容。我们设计并表征了一个采用22nm FD-SOI工艺技术的8kB SRAM,利用所提出的安全策略,展示了在纳秒时间尺度内完成的擦除操作(与传统断电解决方案的295µs相比),其额外面积的成本小于5%。我们还表明,我们的解决方案比没有事先擦除的解决方案更有效,即在单个时钟周期(1ns)内将相同的数据写入所有内存地址。后者的使用降低了归零地址的比例为92%,同时在标称运行条件下增加了2.1倍的运行能耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Near-Instantaneous and Non-Invasive Erasure Design Technique to Protect Sensitive Data Stored in Secure SRAMs
On-chip memories, and in particular SRAMs, are among the most critical components in terms of data security because they might contain sensitive data such as secret keys. Whenever a tampering event is detected, one should be able to erase efficiently and rapidly the full content of a memory holding such sensitive data, but current solutions based on simple power-off lead to very long erasure times. In this paper, we present a non-invasive design technique based on an innovative mechanism to remove electric charges from SRAM bitcells still powered on, before refreshing them with a new content not correlated with the previous one. The particularity of this novel hardware countermeasure is to be natively compatible with any SRAM circuit designed from pushed-rule foundry bitcells. We have designed and characterized an 8kB SRAM in 22nm FD-SOI process technology exploiting the proposed security strategy demonstrating an erase operation accomplished in the nanosecond time scale (versus 295µs with the conventional power-off solution) at the cost of an additional area of less than 5%. We have also shown that our solution is more efficient than a solution without prior erasure consisting in writing identical data to all memory addresses in a single clock cycle (1 ns). The use of the latter drops the ratio of zeroized addresses at 92 %, while increasing the operating energy consumption by 2.1x under nominal operating conditions.
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