问题队列延迟的评估:存储标签RAM和识别正确的关键路径

Kyohei Yamaguchi, Yuya Kora, H. Ando
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引用次数: 10

摘要

在微架构设计中,复杂性和每个周期获得的指令之间的权衡通常是一个重要的问题。在这个设计阶段,需要快速量化相关结构的复杂性(即延迟)。问题队列就是这样一种复杂的结构,它的延迟很难估计。在本文中,我们评估问题队列延迟,以帮助微架构设计。我们的研究包括两个方面:电路设计和评估。首先,我们引入标签RAM,它是组成问题队列的组件之一,以减少延迟。与普通RAM不同,存储标记RAM并不简单,因为它在问题队列的组织中具有唯一性。其次,我们探索并确定问题队列中的正确关键路径。之前的研究对问题队列中各部件的关键路径进行求和,得到了问题队列的时延,但由于各部件的关键路径没有逻辑连接,这并不能提供正确的问题队列时延。在假设采用32nm大规模集成电路技术的评估中,我们获得了8到128个条目的问题队列的延迟。与不存储标签RAM并简单地将每个组件的关键路径延迟相加相比,存储标签RAM并识别正确的关键路径的过程最多可减少20%的延迟。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of issue queue delay: Banking tag RAM and identifying correct critical path
The tradeoff between complexity and attained instructions per cycle is often an important issue in microarchitectural designs. In this design phase, quick quantification of the complexity (i.e., delay) of relevant structures is required. The issue queue is one of such complex structures for which it is difficult to estimate delay. In this paper, we evaluate the issue queue delay to aid microarchitectural design. Our study includes two features: a circuit design and evaluation. First, we introduce banking the tag RAM, which is one of the components comprising the issue queue, to reduce the delay. Unlike normal RAM, banking the tag RAM is not straightforward, because of its uniqueness in the organization of the issue queue. Second, we explore and identify a correct critical path in the issue queue. A previous study summed the critical path of each component in the issue queue to obtain the delay of the issue queue, but this does not provide the correct delay of the issue queue, because the critical paths of each component are not connected logically. In the evaluation assuming 32nm LSI technology, we obtained the delays of an issue queue with eight to 128 entries. The process of banking the tag RAM and identifying the correct critical path reduces the delay by up to 20%, compared with not banking the tag RAM and simply summing the critical path delay of each component.
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