{"title":"用于可靠电子应用的低热阻界面材料失效机制的评估","authors":"K. Wilken, Matthias Grossmann, Cristian De Santis","doi":"10.1109/THERMINIC52472.2021.9626495","DOIUrl":null,"url":null,"abstract":"Thermal interface materials are critical for heat dissipation and thus reliable operation of many electronic parts. Considering future challenges such as autonomous driving, reliability is a key factor for safety and performance. This work studies various failure mechanisms which can occur in polymeric thermal interface materials. Each failure mechanism is linked to an experimental setup/method that may help to gain indications for material screening purposes. Various product classes are screened and put into perspective and benefits of each one of these product classes are discussed.","PeriodicalId":302492,"journal":{"name":"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Evaluation of Failure Mechanisms in Low Thermal Resistance Interface Materials for Reliable Electronics Applications\",\"authors\":\"K. Wilken, Matthias Grossmann, Cristian De Santis\",\"doi\":\"10.1109/THERMINIC52472.2021.9626495\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Thermal interface materials are critical for heat dissipation and thus reliable operation of many electronic parts. Considering future challenges such as autonomous driving, reliability is a key factor for safety and performance. This work studies various failure mechanisms which can occur in polymeric thermal interface materials. Each failure mechanism is linked to an experimental setup/method that may help to gain indications for material screening purposes. Various product classes are screened and put into perspective and benefits of each one of these product classes are discussed.\",\"PeriodicalId\":302492,\"journal\":{\"name\":\"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/THERMINIC52472.2021.9626495\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/THERMINIC52472.2021.9626495","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evaluation of Failure Mechanisms in Low Thermal Resistance Interface Materials for Reliable Electronics Applications
Thermal interface materials are critical for heat dissipation and thus reliable operation of many electronic parts. Considering future challenges such as autonomous driving, reliability is a key factor for safety and performance. This work studies various failure mechanisms which can occur in polymeric thermal interface materials. Each failure mechanism is linked to an experimental setup/method that may help to gain indications for material screening purposes. Various product classes are screened and put into perspective and benefits of each one of these product classes are discussed.