用于可靠电子应用的低热阻界面材料失效机制的评估

K. Wilken, Matthias Grossmann, Cristian De Santis
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引用次数: 2

摘要

热界面材料对许多电子部件的散热和可靠运行至关重要。考虑到自动驾驶等未来挑战,可靠性是安全性和性能的关键因素。本文研究了聚合物热界面材料中可能发生的各种失效机制。每种失效机制都与实验装置/方法相关联,这可能有助于获得用于材料筛选的指示。对各种产品类别进行了筛选和分析,并讨论了每种产品类别的优点。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of Failure Mechanisms in Low Thermal Resistance Interface Materials for Reliable Electronics Applications
Thermal interface materials are critical for heat dissipation and thus reliable operation of many electronic parts. Considering future challenges such as autonomous driving, reliability is a key factor for safety and performance. This work studies various failure mechanisms which can occur in polymeric thermal interface materials. Each failure mechanism is linked to an experimental setup/method that may help to gain indications for material screening purposes. Various product classes are screened and put into perspective and benefits of each one of these product classes are discussed.
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