基于sat的完整逻辑蕴涵及其在逻辑优化中的应用

Yung-Chih Chen, Kung-Ming Ji
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引用次数: 0

摘要

为布尔电路中给定的一组赋值找到必要赋值的逻辑蕴涵在计算机辅助设计领域有着广泛的应用,例如逻辑优化、设计验证和测试模式生成。由于较高的计算复杂度,早期的方法不能或不能找到所有必要的赋值,限制了它们在应用中的质量。随着布尔可满足性求解技术的迅速发展,将高效的布尔可满足性求解技术应用到逻辑蕴涵中似乎是有希望的。因此,本文提出了一种基于sat的完全逻辑蕴涵方法。给定一组赋值,首先模拟大量随机模式,并根据模拟结果收集一组候选必要赋值。然后,它不是逐个验证每个候选者,而是迭代地调用SAT求解器来识别无效候选者并删除它们。在每个SAT求解迭代中,至少可以删除一个无效候选项。最后,只剩下有效的候选人,他们正是所有必要的任务。此外,我们将该方法扩展到计算卡故障测试的所有强制分配,并应用该扩展方法增强了一个逻辑优化算法,该算法的质量很大程度上取决于强制分配计算的完整性。实验结果表明,该方法在可接受的CPU时间开销下,电路尺寸平均减小1.3倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SAT-based complete logic implication with application to logic optimization
Logic implication that finds necessary assignments for a given set of value assignments in a Boolean circuit has a wide set of applications in the computer-aided design field, such as logic optimization, design verification, and test pattern generation. Due to the high computational complexity, earlier methods either cannot or do not find all necessary assignments, limiting their qualities in the applications. With the dramatic advance of Boolean satisfiability (SAT) solving techniques, applying the efficient SAT solving techniques to logic implication seems promising. Thus, the paper presents a SAT-based method for complete logic implication. Given a set of value assignments, it first simulates a large number of random patterns and collects a set of candidate necessary assignments based on the simulation results. Then, instead of validating each candidate one by one, it iteratively calls a SAT solver to identify the invalid candidates and remove them. At each SAT solving iteration, at least one invalid candidate can be removed. Finally, only the valid candidates are left and they are exactly all the necessary assignments. Furthermore, we extend the method to compute all mandatory assignments for a stuck-at fault test and apply the extended method to enhance a logic optimization algorithm whose quality largely depends on the completeness of the mandatory assignment computation. The experimental results show that the enhanced method achieves an average of 1.3× improvement in circuit size reduction with acceptable CPU time overhead.
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