{"title":"一种新的基于测量配电系统电阻变化的物理不可克隆函数","authors":"Jianrui Zhang, J. Xue","doi":"10.1109/ICASID.2012.6325290","DOIUrl":null,"url":null,"abstract":"Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, I propose a simple method to measure resistance variations in the Power Distribution System (PDS) of an IC, and describe how these measurements can be applied to a Physical Unclonable Function (PUF). By applying a sequence of tests using small on-chip support circuits attached to the PDS, the resistance of components of the PDS can be obtained from the solution to a set of simultaneous equations, and be applied to hardware security by forming a PUF. We demonstrate that this PUF signature can then be used to uniquely identify each IC.","PeriodicalId":408223,"journal":{"name":"Anti-counterfeiting, Security, and Identification","volume":"176 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A new Physical Unclonable Functions based on measuring Power Distribution System resistance variations\",\"authors\":\"Jianrui Zhang, J. Xue\",\"doi\":\"10.1109/ICASID.2012.6325290\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, I propose a simple method to measure resistance variations in the Power Distribution System (PDS) of an IC, and describe how these measurements can be applied to a Physical Unclonable Function (PUF). By applying a sequence of tests using small on-chip support circuits attached to the PDS, the resistance of components of the PDS can be obtained from the solution to a set of simultaneous equations, and be applied to hardware security by forming a PUF. We demonstrate that this PUF signature can then be used to uniquely identify each IC.\",\"PeriodicalId\":408223,\"journal\":{\"name\":\"Anti-counterfeiting, Security, and Identification\",\"volume\":\"176 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-10-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Anti-counterfeiting, Security, and Identification\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICASID.2012.6325290\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Anti-counterfeiting, Security, and Identification","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICASID.2012.6325290","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new Physical Unclonable Functions based on measuring Power Distribution System resistance variations
Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, I propose a simple method to measure resistance variations in the Power Distribution System (PDS) of an IC, and describe how these measurements can be applied to a Physical Unclonable Function (PUF). By applying a sequence of tests using small on-chip support circuits attached to the PDS, the resistance of components of the PDS can be obtained from the solution to a set of simultaneous equations, and be applied to hardware security by forming a PUF. We demonstrate that this PUF signature can then be used to uniquely identify each IC.
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