商用电源管理集成电路中的中子诱发位移损伤

Gauri Koli, E. Auden, H. Quinn
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引用次数: 0

摘要

大气中子可以对电源管理集成电路(pmic)产生破坏性影响。用中子辐照了三个商用pmic,以研究低降差(LDO)和降压(Buck)稳压器中的位移损伤效应。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Neutron Induced Displacement Damage in Commercial Power Management Integrated Circuits
Atmospheric neutrons can produce damaging effects in power management integrated circuits (PMICs). Three commercial PMICs have been irradiated with neutrons to investigate displacement damage effects in low drop-out (LDO) and step-down (Buck) voltage regulators.
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