{"title":"短沟道mosfet中从低注入电平到高注入电平的击穿电流模型","authors":"G. Merckel, J. Gautier","doi":"10.1109/IEDM.1978.189458","DOIUrl":null,"url":null,"abstract":"It has been demonstrated that punchthrough operation of short-channel MOSFETs can be usefull for circuit applications [1][2]. The models which are generally used are valid either at low [1], or medium injection levels [3][4]. In this paper we present a model which describes the behavior of punchthrough current versus applied voltage, from low to high injection levels.","PeriodicalId":164556,"journal":{"name":"1978 International Electron Devices Meeting","volume":"449 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A model of punchthrough current in short-channel MOSFETs, from low to high injection levels\",\"authors\":\"G. Merckel, J. Gautier\",\"doi\":\"10.1109/IEDM.1978.189458\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It has been demonstrated that punchthrough operation of short-channel MOSFETs can be usefull for circuit applications [1][2]. The models which are generally used are valid either at low [1], or medium injection levels [3][4]. In this paper we present a model which describes the behavior of punchthrough current versus applied voltage, from low to high injection levels.\",\"PeriodicalId\":164556,\"journal\":{\"name\":\"1978 International Electron Devices Meeting\",\"volume\":\"449 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1978 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1978.189458\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1978 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1978.189458","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A model of punchthrough current in short-channel MOSFETs, from low to high injection levels
It has been demonstrated that punchthrough operation of short-channel MOSFETs can be usefull for circuit applications [1][2]. The models which are generally used are valid either at low [1], or medium injection levels [3][4]. In this paper we present a model which describes the behavior of punchthrough current versus applied voltage, from low to high injection levels.