模拟硅编译器的最坏情况设计和数据表生成技术

ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference Pub Date : 1989-09-01 DOI:10.1109/ESSCIRC.1989.5468146

B. Goffart, J. Jongsma, M. Degrauwe

{"title":"模拟硅编译器的最坏情况设计和数据表生成技术","authors":"B. Goffart, J. Jongsma, M. Degrauwe","doi":"10.1109/ESSCIRC.1989.5468146","DOIUrl":null,"url":null,"abstract":"Worst case design and datasheet generation techniques for analog circuits, based on analytic expressions, are presented. They take into account temperature, bias current and technology parameter fluctuations. The techniques which have been implemented in an analog design system, operating with \"design strategies\" as well as \"numerical optimization methods\", do not degrade significantly the design time.","PeriodicalId":187183,"journal":{"name":"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Worst Case Design and Datasheet Generation Techniques for Analog Silicon Compilers\",\"authors\":\"B. Goffart, J. Jongsma, M. Degrauwe\",\"doi\":\"10.1109/ESSCIRC.1989.5468146\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Worst case design and datasheet generation techniques for analog circuits, based on analytic expressions, are presented. They take into account temperature, bias current and technology parameter fluctuations. The techniques which have been implemented in an analog design system, operating with \\\"design strategies\\\" as well as \\\"numerical optimization methods\\\", do not degrade significantly the design time.\",\"PeriodicalId\":187183,\"journal\":{\"name\":\"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESSCIRC.1989.5468146\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSCIRC.1989.5468146","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

给出了基于解析表达式的模拟电路的最坏情况设计和数据表生成技术。它们考虑了温度、偏置电流和工艺参数的波动。在模拟设计系统中实现的技术，与“设计策略”和“数值优化方法”一起操作，不会显着降低设计时间。

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Worst Case Design and Datasheet Generation Techniques for Analog Silicon Compilers

Worst case design and datasheet generation techniques for analog circuits, based on analytic expressions, are presented. They take into account temperature, bias current and technology parameter fluctuations. The techniques which have been implemented in an analog design system, operating with "design strategies" as well as "numerical optimization methods", do not degrade significantly the design time.

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ESSCIRC '89: Proceedings of the 15th European Solid-State Circuits Conference

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