嵌入式伪SRAM的功率门控技术

Ching-Yun Cheng, Ming-Hung Chang, W. Hwang
{"title":"嵌入式伪SRAM的功率门控技术","authors":"Ching-Yun Cheng, Ming-Hung Chang, W. Hwang","doi":"10.1109/VDAT.2007.373251","DOIUrl":null,"url":null,"abstract":"In this paper, we deploy power gating technique on a low-power Pseudo SRAM circuit with 3T1D gain cell. A 256-word x 32-BL-pair 3T1D gain cell array is implemented in standard logic technology with TSMC 0.13 um model for multi-bank Pseudo SRAM. Each Pseudo SRAM has its independent access control unit, enabling parallel refresh and read-write accesses to different bank. By employing power gating technique in sense amplifier of 3T1D gain cell array, 15% standby leakage current during sleep mode could be reduced. Also, 12% sensing speed could be enhanced when Pseudo SRAM is operated in normal mode (simulated with TSMC 100 nm technology model).","PeriodicalId":137915,"journal":{"name":"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Power Gating Technique for Embedded Pseudo SRAM\",\"authors\":\"Ching-Yun Cheng, Ming-Hung Chang, W. Hwang\",\"doi\":\"10.1109/VDAT.2007.373251\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we deploy power gating technique on a low-power Pseudo SRAM circuit with 3T1D gain cell. A 256-word x 32-BL-pair 3T1D gain cell array is implemented in standard logic technology with TSMC 0.13 um model for multi-bank Pseudo SRAM. Each Pseudo SRAM has its independent access control unit, enabling parallel refresh and read-write accesses to different bank. By employing power gating technique in sense amplifier of 3T1D gain cell array, 15% standby leakage current during sleep mode could be reduced. Also, 12% sensing speed could be enhanced when Pseudo SRAM is operated in normal mode (simulated with TSMC 100 nm technology model).\",\"PeriodicalId\":137915,\"journal\":{\"name\":\"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VDAT.2007.373251\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VDAT.2007.373251","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

在本文中,我们在一个具有3T1D增益单元的低功耗伪SRAM电路上部署功率门控技术。采用标准逻辑技术,采用台积电0.13 um模型实现了256字x 32- bl对3T1D增益单元阵列,用于多组伪SRAM。每个伪SRAM都有独立的访问控制单元,可以实现对不同银行的并行刷新和读写访问。在3T1D增益单元阵列的感测放大器中采用功率门控技术,可使其在休眠模式下的待机漏电流降低15%。此外,当Pseudo SRAM在正常模式下工作时(采用台积电100纳米技术模型进行模拟),传感速度可提高12%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Power Gating Technique for Embedded Pseudo SRAM
In this paper, we deploy power gating technique on a low-power Pseudo SRAM circuit with 3T1D gain cell. A 256-word x 32-BL-pair 3T1D gain cell array is implemented in standard logic technology with TSMC 0.13 um model for multi-bank Pseudo SRAM. Each Pseudo SRAM has its independent access control unit, enabling parallel refresh and read-write accesses to different bank. By employing power gating technique in sense amplifier of 3T1D gain cell array, 15% standby leakage current during sleep mode could be reduced. Also, 12% sensing speed could be enhanced when Pseudo SRAM is operated in normal mode (simulated with TSMC 100 nm technology model).
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信