{"title":"衬底馈电CMOS存储器件","authors":"T. Iizuka","doi":"10.1109/IEDM.1978.189392","DOIUrl":null,"url":null,"abstract":"A novel structure of a negative resistance diode for high density static RAM cell is described. The diode, called Substrate-Fed CMOS (SF-CMOS) diode, consists of weak depletion type p- and n-MOSTs, whose drains are formed in the p-well and n-substrate, respectively. The structure enables supplying a diode current via substrate. Drain currents for the FETs, which operate in the subthreshold region, are controlled by back-gate bias, resulting in a sharp negative resistance with an \"OFF\" current below 1pA. The SF-CMOS diode plus a transfer-gate transistor and a load element make up a memory cell. The feasibility of using a polysilicon resistor, a leaky diode and a MOSFET for the load element is discussed. An eight-by-eight cell array of SF-CMOS cells with MOSFET loads is fabricated and examined. Using a 5µm line width and 3µm spacing design rule, the obtained cell size is 1440µm2, compared with 3000µm2required for a six-transistor cell. A 4096-word by 1-bit static RAM has been designed using SF-CMOS cells. The obtained chip size is as small as 14.9mm2. READ and WRITE operations of the RAM are similar to those of single transistor cells, except that SF-CMOS cells need no refresh operation. A 45 ns access time has been obtained with 5-volt VDD, using computer simulation.","PeriodicalId":164556,"journal":{"name":"1978 International Electron Devices Meeting","volume":"52 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Substrate-fed CMOS memory device\",\"authors\":\"T. Iizuka\",\"doi\":\"10.1109/IEDM.1978.189392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel structure of a negative resistance diode for high density static RAM cell is described. The diode, called Substrate-Fed CMOS (SF-CMOS) diode, consists of weak depletion type p- and n-MOSTs, whose drains are formed in the p-well and n-substrate, respectively. The structure enables supplying a diode current via substrate. Drain currents for the FETs, which operate in the subthreshold region, are controlled by back-gate bias, resulting in a sharp negative resistance with an \\\"OFF\\\" current below 1pA. The SF-CMOS diode plus a transfer-gate transistor and a load element make up a memory cell. The feasibility of using a polysilicon resistor, a leaky diode and a MOSFET for the load element is discussed. An eight-by-eight cell array of SF-CMOS cells with MOSFET loads is fabricated and examined. Using a 5µm line width and 3µm spacing design rule, the obtained cell size is 1440µm2, compared with 3000µm2required for a six-transistor cell. A 4096-word by 1-bit static RAM has been designed using SF-CMOS cells. The obtained chip size is as small as 14.9mm2. READ and WRITE operations of the RAM are similar to those of single transistor cells, except that SF-CMOS cells need no refresh operation. A 45 ns access time has been obtained with 5-volt VDD, using computer simulation.\",\"PeriodicalId\":164556,\"journal\":{\"name\":\"1978 International Electron Devices Meeting\",\"volume\":\"52 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1978 International Electron Devices Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.1978.189392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1978 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1978.189392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel structure of a negative resistance diode for high density static RAM cell is described. The diode, called Substrate-Fed CMOS (SF-CMOS) diode, consists of weak depletion type p- and n-MOSTs, whose drains are formed in the p-well and n-substrate, respectively. The structure enables supplying a diode current via substrate. Drain currents for the FETs, which operate in the subthreshold region, are controlled by back-gate bias, resulting in a sharp negative resistance with an "OFF" current below 1pA. The SF-CMOS diode plus a transfer-gate transistor and a load element make up a memory cell. The feasibility of using a polysilicon resistor, a leaky diode and a MOSFET for the load element is discussed. An eight-by-eight cell array of SF-CMOS cells with MOSFET loads is fabricated and examined. Using a 5µm line width and 3µm spacing design rule, the obtained cell size is 1440µm2, compared with 3000µm2required for a six-transistor cell. A 4096-word by 1-bit static RAM has been designed using SF-CMOS cells. The obtained chip size is as small as 14.9mm2. READ and WRITE operations of the RAM are similar to those of single transistor cells, except that SF-CMOS cells need no refresh operation. A 45 ns access time has been obtained with 5-volt VDD, using computer simulation.