衬底馈电CMOS存储器件

T. Iizuka
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引用次数: 1

摘要

介绍了一种用于高密度静态RAM电池的负阻二极管的新结构。这种二极管被称为基片馈电式CMOS (SF-CMOS)二极管,由弱耗尽型p-和n-MOSTs组成,其漏极分别形成于p-阱和n-衬底。该结构能够通过衬底提供二极管电流。在亚阈值区域工作的fet的漏极电流由后门偏置控制,导致具有低于1pA的“OFF”电流的急剧负电阻。SF-CMOS二极管加上一个转移门晶体管和一个负载元件组成一个存储单元。讨论了采用多晶硅电阻、漏极二极管和MOSFET作为负载元件的可行性。制作并测试了带有MOSFET负载的8 × 8单元的SF-CMOS单元阵列。采用5µm线宽和3µm间距设计规则,获得的电池尺寸为1440µm2,而6晶体管电池需要3000µm2。采用SF-CMOS单元设计了4096字× 1位静态RAM。得到的芯片尺寸小至14.9mm2。RAM的READ和WRITE操作类似于单晶体管单元,除了SF-CMOS单元不需要刷新操作。通过计算机仿真,在5伏VDD下获得了45 ns的接入时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Substrate-fed CMOS memory device
A novel structure of a negative resistance diode for high density static RAM cell is described. The diode, called Substrate-Fed CMOS (SF-CMOS) diode, consists of weak depletion type p- and n-MOSTs, whose drains are formed in the p-well and n-substrate, respectively. The structure enables supplying a diode current via substrate. Drain currents for the FETs, which operate in the subthreshold region, are controlled by back-gate bias, resulting in a sharp negative resistance with an "OFF" current below 1pA. The SF-CMOS diode plus a transfer-gate transistor and a load element make up a memory cell. The feasibility of using a polysilicon resistor, a leaky diode and a MOSFET for the load element is discussed. An eight-by-eight cell array of SF-CMOS cells with MOSFET loads is fabricated and examined. Using a 5µm line width and 3µm spacing design rule, the obtained cell size is 1440µm2, compared with 3000µm2required for a six-transistor cell. A 4096-word by 1-bit static RAM has been designed using SF-CMOS cells. The obtained chip size is as small as 14.9mm2. READ and WRITE operations of the RAM are similar to those of single transistor cells, except that SF-CMOS cells need no refresh operation. A 45 ns access time has been obtained with 5-volt VDD, using computer simulation.
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