{"title":"悬臂梁MEM触点开关的紧凑模型","authors":"T. Veijola","doi":"10.1109/ECCTD.2005.1522906","DOIUrl":null,"url":null,"abstract":"A compact model for a cantilever beam microelectromechanical (MEM) contact switch is constructed. The beam deflection is modeled by discretizing the beam along its length. The distributed capacitance, electrostatic force and squeezed-film fluid force are also calculated at the same discrete points. The electromechanical contact tip is modeled as a lumped contact force and conductance. The model is implemented with a nonlinear equivalent circuit utilizing the components in the MEMS module of the circuit simulation and design tool Aplac. This enables nonlinear time and frequency domain simulations. This paper presents transient on/off characteristics simulations, and analyses and compares the S-parameters at the on- and off-positions.","PeriodicalId":266120,"journal":{"name":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Compact model for a cantilever beam MEM contact switch\",\"authors\":\"T. Veijola\",\"doi\":\"10.1109/ECCTD.2005.1522906\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A compact model for a cantilever beam microelectromechanical (MEM) contact switch is constructed. The beam deflection is modeled by discretizing the beam along its length. The distributed capacitance, electrostatic force and squeezed-film fluid force are also calculated at the same discrete points. The electromechanical contact tip is modeled as a lumped contact force and conductance. The model is implemented with a nonlinear equivalent circuit utilizing the components in the MEMS module of the circuit simulation and design tool Aplac. This enables nonlinear time and frequency domain simulations. This paper presents transient on/off characteristics simulations, and analyses and compares the S-parameters at the on- and off-positions.\",\"PeriodicalId\":266120,\"journal\":{\"name\":\"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2005.1522906\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2005 European Conference on Circuit Theory and Design, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2005.1522906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Compact model for a cantilever beam MEM contact switch
A compact model for a cantilever beam microelectromechanical (MEM) contact switch is constructed. The beam deflection is modeled by discretizing the beam along its length. The distributed capacitance, electrostatic force and squeezed-film fluid force are also calculated at the same discrete points. The electromechanical contact tip is modeled as a lumped contact force and conductance. The model is implemented with a nonlinear equivalent circuit utilizing the components in the MEMS module of the circuit simulation and design tool Aplac. This enables nonlinear time and frequency domain simulations. This paper presents transient on/off characteristics simulations, and analyses and compares the S-parameters at the on- and off-positions.