各种测试技术设计的成本权衡

Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing Pub Date : 1994-05-16 DOI:10.1109/ICEDTM.1994.496091

H.B. Druckerman, M. P. Kusko, S. Pateras, P. Shephard

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引用次数: 6

摘要

测试成本正在成为当今复杂芯片设计的一个主要因素。降低测试成本的一种方法是让产品自己进行测试，或者帮助测试。为此目的开发了各种各样的为测试而设计的技术。针对各种相关的成本问题对其中一些技术进行了评估。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Cost trade-offs of various design for test techniques

Test cost is becoming a major factor in today's complex chip designs. One approach to lower test cost is to have the product test, or help test, itself. There are a wide variety of Design-for-Test techniques that have been developed for this purpose. A number of these techniques are evaluated against various related cost issues.

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Proceedings of 3rd International Workshop on the Economics of Design, Test and Manufacturing

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