提高质量:产量与测试覆盖率(WSI)

1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration Pub Date : 1993-01-20 DOI:10.1109/ICWSI.1993.255250

Steven D. Millman

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引用次数: 9

摘要

结果表明，对于测试覆盖率和产量的典型值，增加测试覆盖率将以较低的成本对质量产生更大的影响，而不是类似的增加产量。即使产量的增加远远大于测试覆盖率的增加，这种关系也经常成立。必须确保测试覆盖是基于准确描述故障芯片行为的故障模型，并且模拟的故障准确地表示实际发生的故障。

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Improving quality: yield vs. test coverage (WSI)

It is shown that for typical values of test coverage and yield, increasing the test coverage will have a greater impact on quality for a lower cost than similar increases in yield. This relationship often holds even when the increase in yield is much larger than the increase in test coverage. It must be ensured that the test coverage is based on fault models that accurately describe the behavior of fault chips, and that the simulated faults accurately represent the failures that actually occur.<>

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1993 Proceedings Fifth Annual IEEE International Conference on Wafer Scale Integration

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