{"title":"GaN晶体管同步升压变换器的死区时间发生器","authors":"M. Macellari, F. Celani, L. Schirone","doi":"10.1109/IEVC.2014.7056113","DOIUrl":null,"url":null,"abstract":"An analog dynamic dead time generator for synchronous boost converters based on GaN transistors is presented. A prototype was designed to operate at switching frequencies in the MHz range, with wide variations of the output voltage, and experimentally demonstrated its capability to stabilize the dead time duration to a few nanoseconds, independent of wide variations of the switching times of the transistor in use.","PeriodicalId":223794,"journal":{"name":"2014 IEEE International Electric Vehicle Conference (IEVC)","volume":"172 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Dead time generator for synchronous boost converters with GaN transistors\",\"authors\":\"M. Macellari, F. Celani, L. Schirone\",\"doi\":\"10.1109/IEVC.2014.7056113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An analog dynamic dead time generator for synchronous boost converters based on GaN transistors is presented. A prototype was designed to operate at switching frequencies in the MHz range, with wide variations of the output voltage, and experimentally demonstrated its capability to stabilize the dead time duration to a few nanoseconds, independent of wide variations of the switching times of the transistor in use.\",\"PeriodicalId\":223794,\"journal\":{\"name\":\"2014 IEEE International Electric Vehicle Conference (IEVC)\",\"volume\":\"172 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE International Electric Vehicle Conference (IEVC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEVC.2014.7056113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Electric Vehicle Conference (IEVC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEVC.2014.7056113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Dead time generator for synchronous boost converters with GaN transistors
An analog dynamic dead time generator for synchronous boost converters based on GaN transistors is presented. A prototype was designed to operate at switching frequencies in the MHz range, with wide variations of the output voltage, and experimentally demonstrated its capability to stabilize the dead time duration to a few nanoseconds, independent of wide variations of the switching times of the transistor in use.