Jae-Young Park, Jong-Kyu Song, Chang-Soo Jang, Young-Sang Son, Dae-Woo Kim
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Analysis and modeling of a Low Voltage Triggered SCR ESD protection clamp with the very fast Transmission Line Pulse measurement
The analysis and the modeling of a Low Voltage Triggered SCR (Silicon Controlled Rectifier) under vf-TLP (very-fast Transmission Line Pulse) measurements are reported. The results measured by vf-TLP system showed that the triggering voltage (Vt1) decreased and the second breakdown current (It2) increased in the comparison with the results measured by a standard 100ns TLP (Transmission Line Pulse) system. A compact model based on the vf-TLP measured characteristics is presented. The measurement result and the simulation data of the behavior approached model indicate a good correlation.
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