J. Moon, D. Curtis, M. Hu, S. Bui, D. Wheeler, T. Marshall, H. Sharifi, D. Wong, D. Gaskill, P. Campbell, P. Asbeck, G. Jernigan, J. Tedesco, B. Vanmil, R. Myers-Ward, C. Eddy, X. Weng, J. Robinson, M. Fanton
{"title":"自对准石墨烯- sic和石墨烯- si mosfet在75毫米晶圆","authors":"J. Moon, D. Curtis, M. Hu, S. Bui, D. Wheeler, T. Marshall, H. Sharifi, D. Wong, D. Gaskill, P. Campbell, P. Asbeck, G. Jernigan, J. Tedesco, B. Vanmil, R. Myers-Ward, C. Eddy, X. Weng, J. Robinson, M. Fanton","doi":"10.1109/DRC.2010.5551910","DOIUrl":null,"url":null,"abstract":"Graphene has shown the highest carrier Hall mobility of >100,000 cm2/Vs with theoretical saturation velocity (Vsat) and source-injection velocity converging at ∼5E7 cm/sec [1] and ∼6E7 cm/sec, respectively. A potential combination of high current-carrying density, transconductance, and low access resistance could make graphene an attractive candidate for high-performance RF applications. So far, epitaxial graphene MOSFETs [2] in the early stages of development have revealed technical challenges: the current-voltage characteristics are quasi-linear with weak saturation behaviors and low transconductance per gate capacitance (<100 mS/mm). In addition, the Ion/Ioff ratio has been <10. While epitaxial graphene RF FETs with Fmax of 14 GHz per 2 µm gate length were demonstrated in a self-aligned top-gated layout with the highest ever on-state current density of 3 A/mm at Vds = 5 V, field-effect mobility was limited below 200 cm2/Vs. There are only a few reports of a graphene-on-Si platform with on-stage current <0.02 mA/mm. [3]","PeriodicalId":396875,"journal":{"name":"68th Device Research Conference","volume":"311 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Self-aligned graphene-on-SiC and graphene-on-Si MOSFETs on 75 mm wafers\",\"authors\":\"J. Moon, D. Curtis, M. Hu, S. Bui, D. Wheeler, T. Marshall, H. Sharifi, D. Wong, D. Gaskill, P. Campbell, P. Asbeck, G. Jernigan, J. Tedesco, B. Vanmil, R. Myers-Ward, C. Eddy, X. Weng, J. Robinson, M. Fanton\",\"doi\":\"10.1109/DRC.2010.5551910\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Graphene has shown the highest carrier Hall mobility of >100,000 cm2/Vs with theoretical saturation velocity (Vsat) and source-injection velocity converging at ∼5E7 cm/sec [1] and ∼6E7 cm/sec, respectively. A potential combination of high current-carrying density, transconductance, and low access resistance could make graphene an attractive candidate for high-performance RF applications. So far, epitaxial graphene MOSFETs [2] in the early stages of development have revealed technical challenges: the current-voltage characteristics are quasi-linear with weak saturation behaviors and low transconductance per gate capacitance (<100 mS/mm). In addition, the Ion/Ioff ratio has been <10. While epitaxial graphene RF FETs with Fmax of 14 GHz per 2 µm gate length were demonstrated in a self-aligned top-gated layout with the highest ever on-state current density of 3 A/mm at Vds = 5 V, field-effect mobility was limited below 200 cm2/Vs. There are only a few reports of a graphene-on-Si platform with on-stage current <0.02 mA/mm. [3]\",\"PeriodicalId\":396875,\"journal\":{\"name\":\"68th Device Research Conference\",\"volume\":\"311 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"68th Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DRC.2010.5551910\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"68th Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2010.5551910","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Self-aligned graphene-on-SiC and graphene-on-Si MOSFETs on 75 mm wafers
Graphene has shown the highest carrier Hall mobility of >100,000 cm2/Vs with theoretical saturation velocity (Vsat) and source-injection velocity converging at ∼5E7 cm/sec [1] and ∼6E7 cm/sec, respectively. A potential combination of high current-carrying density, transconductance, and low access resistance could make graphene an attractive candidate for high-performance RF applications. So far, epitaxial graphene MOSFETs [2] in the early stages of development have revealed technical challenges: the current-voltage characteristics are quasi-linear with weak saturation behaviors and low transconductance per gate capacitance (<100 mS/mm). In addition, the Ion/Ioff ratio has been <10. While epitaxial graphene RF FETs with Fmax of 14 GHz per 2 µm gate length were demonstrated in a self-aligned top-gated layout with the highest ever on-state current density of 3 A/mm at Vds = 5 V, field-effect mobility was limited below 200 cm2/Vs. There are only a few reports of a graphene-on-Si platform with on-stage current <0.02 mA/mm. [3]