{"title":"基于蚁群算法的SoC分级测试调度","authors":"Xiaole Cui, Wei Cheng, Xiaoye Wang, Liang Yin, Yachun Sun, Yan Zhou","doi":"10.1109/ASICON.2009.5351198","DOIUrl":null,"url":null,"abstract":"SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the Ant Colony Optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC'02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.","PeriodicalId":446584,"journal":{"name":"2009 IEEE 8th International Conference on ASIC","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Hierarchical SoC testing scheduling based on the ant colony algorithm\",\"authors\":\"Xiaole Cui, Wei Cheng, Xiaoye Wang, Liang Yin, Yachun Sun, Yan Zhou\",\"doi\":\"10.1109/ASICON.2009.5351198\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the Ant Colony Optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC'02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.\",\"PeriodicalId\":446584,\"journal\":{\"name\":\"2009 IEEE 8th International Conference on ASIC\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE 8th International Conference on ASIC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASICON.2009.5351198\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE 8th International Conference on ASIC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASICON.2009.5351198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hierarchical SoC testing scheduling based on the ant colony algorithm
SoC testing scheduling is an NP hard problem, and it is more complex for the hierarchical SoC architecture. By formulating the SoC testing scheduling problem as a 2-D bin-packing model, this paper solves the problem for the hierarchical SoC with the Ant Colony Optimization (ACO) algorithm to reduce testing application time. Experimental results on ITC'02 benchmark circuits show that the ACO algorithm is more effective than earlier proposed methods.