实际解决方案的应用振荡测试:启动和芯片上的评估

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) Pub Date : 2002-04-28 DOI:10.1109/VTS.2002.1011176

D. Vázquez, G. Huertas, G. Léger, A. Rueda, J. Huertas

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引用次数: 9

摘要

本文为应用基于振荡的测试时产生的两个主要主题提出了实用的解决方案:配置振荡器的启动和生成测试信号的片上评估。所需的电路非常简单和坚固。此外，还包括了一个集成样机的初步结果。

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Practical solutions for the application of the oscillation-based-test: start-up and on-chip evaluation

This paper presents practical solutions for two of the main topics arising when applying oscillation-based-test: the start-up of the configured oscillator and the on-chip evaluation of the generated test signals. The required circuitry is very simple and robust. Moreover, preliminary results obtained from an integrated prototype are also included.

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Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

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