{"title":"利用全局加性高斯过程和局部加性高斯过程模型增强全局优化的模式搜索","authors":"Qun Meng, S. Ng","doi":"10.1109/WSC.2017.8247942","DOIUrl":null,"url":null,"abstract":"Optimization of complex real-time control systems often requires efficient response to any system changes over time. By combining pattern search optimization with a fast estimated Gaussian Process model, we are able to perform global optimization more efficiently for response surfaces with multiple local minimums or even dramatic changes over the design space. Our approach extends pattern search for global optimization problems by incorporating the global and local information provided by an additive global and local Gaussian Process model. We further develop a global search method to identify multiple promising local regions for parallel implementation of local pattern search. We demonstrate our methods on a standard test problem.","PeriodicalId":145780,"journal":{"name":"2017 Winter Simulation Conference (WSC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Enhancing pattern search for global optimization with an additive global and local Gaussian Process model\",\"authors\":\"Qun Meng, S. Ng\",\"doi\":\"10.1109/WSC.2017.8247942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Optimization of complex real-time control systems often requires efficient response to any system changes over time. By combining pattern search optimization with a fast estimated Gaussian Process model, we are able to perform global optimization more efficiently for response surfaces with multiple local minimums or even dramatic changes over the design space. Our approach extends pattern search for global optimization problems by incorporating the global and local information provided by an additive global and local Gaussian Process model. We further develop a global search method to identify multiple promising local regions for parallel implementation of local pattern search. We demonstrate our methods on a standard test problem.\",\"PeriodicalId\":145780,\"journal\":{\"name\":\"2017 Winter Simulation Conference (WSC)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Winter Simulation Conference (WSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WSC.2017.8247942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Winter Simulation Conference (WSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WSC.2017.8247942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhancing pattern search for global optimization with an additive global and local Gaussian Process model
Optimization of complex real-time control systems often requires efficient response to any system changes over time. By combining pattern search optimization with a fast estimated Gaussian Process model, we are able to perform global optimization more efficiently for response surfaces with multiple local minimums or even dramatic changes over the design space. Our approach extends pattern search for global optimization problems by incorporating the global and local information provided by an additive global and local Gaussian Process model. We further develop a global search method to identify multiple promising local regions for parallel implementation of local pattern search. We demonstrate our methods on a standard test problem.