带有片上ECC的64Kb CMOS EEROM

S. Mehrotra, Tsung-Ching Wu, Te-Long Chiu, G. Perlegos
{"title":"带有片上ECC的64Kb CMOS EEROM","authors":"S. Mehrotra, Tsung-Ching Wu, Te-Long Chiu, G. Perlegos","doi":"10.1109/ISSCC.1984.1156662","DOIUrl":null,"url":null,"abstract":"A 5V-only 64Kb EEROM using a 1.5μm N-well CMOS on epi technology, and featuring a 85μm<sup>2</sup>two-transistor cell and 33100 mil<sup>2</sup>die area, will be reported. Address edge detection circuit techniques have resulted in a 100ns typical access time at 50mW active power dissipation.","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A 64Kb CMOS EEROM with on-chip ECC\",\"authors\":\"S. Mehrotra, Tsung-Ching Wu, Te-Long Chiu, G. Perlegos\",\"doi\":\"10.1109/ISSCC.1984.1156662\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 5V-only 64Kb EEROM using a 1.5μm N-well CMOS on epi technology, and featuring a 85μm<sup>2</sup>two-transistor cell and 33100 mil<sup>2</sup>die area, will be reported. Address edge detection circuit techniques have resulted in a 100ns typical access time at 50mW active power dissipation.\",\"PeriodicalId\":260117,\"journal\":{\"name\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1984.1156662\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156662","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

采用1.5μm n阱CMOS on epi技术的5V-only 64Kb EEROM,具有85μ m22的双晶体管电池和33100 mil2的芯片面积。地址边缘检测电路技术在50mW有功功耗下实现了100ns的典型访问时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 64Kb CMOS EEROM with on-chip ECC
A 5V-only 64Kb EEROM using a 1.5μm N-well CMOS on epi technology, and featuring a 85μm2two-transistor cell and 33100 mil2die area, will be reported. Address edge detection circuit techniques have resulted in a 100ns typical access time at 50mW active power dissipation.
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