{"title":"一种用于实现自检fpga的基于cmos的逻辑单元","authors":"P. Lala, Anup Singh, A. Walker","doi":"10.1109/DFTVS.1999.802890","DOIUrl":null,"url":null,"abstract":"This paper proposes a logic cell that can be used as a building block for online testable FPGAs. The proposed logic cell consists of two 2-to-1 multiplexers, three 4-to-1 multiplexers and a D flip-flop. The cell has been designed using Differential Cascode Voltage Switch (DCVS) logic. It is self-checking for all single transistor stuck-on and stuck-off faults as well as stuck-at faults at the inputs of each multiplexer and the D flip-flop. The multiplexers and the D flip-flop provide either correct (complementary) output in the absence of above-mentioned faults or identical outputs in the presence of fault.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"649 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A CMOS-based logic cell for the implementation of self-checking FPGAs\",\"authors\":\"P. Lala, Anup Singh, A. Walker\",\"doi\":\"10.1109/DFTVS.1999.802890\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a logic cell that can be used as a building block for online testable FPGAs. The proposed logic cell consists of two 2-to-1 multiplexers, three 4-to-1 multiplexers and a D flip-flop. The cell has been designed using Differential Cascode Voltage Switch (DCVS) logic. It is self-checking for all single transistor stuck-on and stuck-off faults as well as stuck-at faults at the inputs of each multiplexer and the D flip-flop. The multiplexers and the D flip-flop provide either correct (complementary) output in the absence of above-mentioned faults or identical outputs in the presence of fault.\",\"PeriodicalId\":448322,\"journal\":{\"name\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"volume\":\"649 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1999.802890\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802890","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A CMOS-based logic cell for the implementation of self-checking FPGAs
This paper proposes a logic cell that can be used as a building block for online testable FPGAs. The proposed logic cell consists of two 2-to-1 multiplexers, three 4-to-1 multiplexers and a D flip-flop. The cell has been designed using Differential Cascode Voltage Switch (DCVS) logic. It is self-checking for all single transistor stuck-on and stuck-off faults as well as stuck-at faults at the inputs of each multiplexer and the D flip-flop. The multiplexers and the D flip-flop provide either correct (complementary) output in the absence of above-mentioned faults or identical outputs in the presence of fault.