V. Kolchuzhin, J. Mehner, E. Sheremet, B. Kunal, R. D. Rodriguez, D. Zahn
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Understanding tip-enhanced Raman spectroscopy by multiphysics finite element simulations
This article deals with the models development and FE simulations for mechanical properties of all-metal AFM-TERS tips and electric field enhancement between the tip and the sample. The most important aspects in simulations, the parameters necessary in creating models, and the obtained results are presented and discussed in the article.
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