半导体激光二极管初始热特性与寿命投影的关系

1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206) Pub Date : 1998-05-25 DOI:10.1109/ECTC.1998.678930

N. Hwang, Sang-Hwan Lee, G. Joo, Min-Kyu Song, K. Pyun

{"title":"半导体激光二极管初始热特性与寿命投影的关系","authors":"N. Hwang, Sang-Hwan Lee, G. Joo, Min-Kyu Song, K. Pyun","doi":"10.1109/ECTC.1998.678930","DOIUrl":null,"url":null,"abstract":"A novel reliability projection model of semiconductor laser diodes (LD) is presented. By correlating initial thermal characteristics and long-term degradation, a relationship between LD degradation and ambient temperature has been investigated. The proposed model is found to be efficient for the reliability projection of LDs, which requires a thermal characterization only at t=0.","PeriodicalId":422475,"journal":{"name":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Relationship between initial thermal characteristics and lifetime projection of semiconductor laser diodes\",\"authors\":\"N. Hwang, Sang-Hwan Lee, G. Joo, Min-Kyu Song, K. Pyun\",\"doi\":\"10.1109/ECTC.1998.678930\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel reliability projection model of semiconductor laser diodes (LD) is presented. By correlating initial thermal characteristics and long-term degradation, a relationship between LD degradation and ambient temperature has been investigated. The proposed model is found to be efficient for the reliability projection of LDs, which requires a thermal characterization only at t=0.\",\"PeriodicalId\":422475,\"journal\":{\"name\":\"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1998.678930\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1998.678930","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

提出了一种新的半导体激光二极管(LD)可靠性投影模型。通过将初始热特性与长期降解相关联，研究了LD降解与环境温度的关系。所提出的模型对于ld的可靠性投影是有效的，它只需要在t=0时进行热表征。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Relationship between initial thermal characteristics and lifetime projection of semiconductor laser diodes

A novel reliability projection model of semiconductor laser diodes (LD) is presented. By correlating initial thermal characteristics and long-term degradation, a relationship between LD degradation and ambient temperature has been investigated. The proposed model is found to be efficient for the reliability projection of LDs, which requires a thermal characterization only at t=0.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)

自引率

0.00%

发文量