Bi1.8Sb0.2Te1.5Se1.5 (BSTS)单晶生长及结构表征

DAE SOLID STATE PHYSICS SYMPOSIUM 2019 Pub Date : 2020-11-05 DOI:10.1063/5.0017664

P. K. Ghose, T. K. Dalui, S. Giri

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引用次数: 2

摘要

本文报道了块状Bi1.8Sb0.2Te1.5Se1.5单晶的生长和x射线衍射表征。采用改进的Bridgman法生长Bi1.8Sb0.2Te1.5Se1.5单晶。{0,0,3}面对应的衍射峰显示了晶体沿c方向的生长。利用Rietveld细化对x射线衍射图进行分析，验证了相纯度，并确定了具有R-3m空间群的菱面体结构。

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Single crystal growth and structural characterization of Bi1.8Sb0.2Te1.5Se1.5 (BSTS) single crystal

We report the single crystal growth and X-ray diffraction characterization of bulk Bi1.8Sb0.2Te1.5Se1.5 single crystals. Single crystal of Bi1.8Sb0.2Te1.5Se1.5 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planes reveal the growth of crystal along the c-direction. Analysis of X-ray diffraction pattern using Rietveld refinement verifies the phase purity, and confirms rhombohedral structure with R-3m space group.

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DAE SOLID STATE PHYSICS SYMPOSIUM 2019

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