{"title":"介子在半导体研究中的作用","authors":"P. W. Mengyan","doi":"10.1049/pbcs045e_ch5","DOIUrl":null,"url":null,"abstract":"The aim of this chapter is to provide an introduction and overview of using muons to study defects in semiconductors for an audience with a background in material science. First is a general tutorial to relevant models and discussion of the muon-based techniques that have been important to the semiconductor field. The latter portion of this chapter highlights results from selected studies on semiconductors to demonstrate and describe some contributions that muon spin research (SR) techniques have made to the semiconductor community in recent years.","PeriodicalId":247105,"journal":{"name":"Characterisation and Control of Defects in Semiconductors","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The role of muons in semiconductor research\",\"authors\":\"P. W. Mengyan\",\"doi\":\"10.1049/pbcs045e_ch5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The aim of this chapter is to provide an introduction and overview of using muons to study defects in semiconductors for an audience with a background in material science. First is a general tutorial to relevant models and discussion of the muon-based techniques that have been important to the semiconductor field. The latter portion of this chapter highlights results from selected studies on semiconductors to demonstrate and describe some contributions that muon spin research (SR) techniques have made to the semiconductor community in recent years.\",\"PeriodicalId\":247105,\"journal\":{\"name\":\"Characterisation and Control of Defects in Semiconductors\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Characterisation and Control of Defects in Semiconductors\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1049/pbcs045e_ch5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Characterisation and Control of Defects in Semiconductors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/pbcs045e_ch5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The aim of this chapter is to provide an introduction and overview of using muons to study defects in semiconductors for an audience with a background in material science. First is a general tutorial to relevant models and discussion of the muon-based techniques that have been important to the semiconductor field. The latter portion of this chapter highlights results from selected studies on semiconductors to demonstrate and describe some contributions that muon spin research (SR) techniques have made to the semiconductor community in recent years.
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