{"title":"可靠性会限制摩尔定律吗?","authors":"A. Oates","doi":"10.1109/IEDM.2014.7047092","DOIUrl":null,"url":null,"abstract":"Summary form only given. Moore's law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore's law. In this talk we will discuss reliability issues that can most directly impact the industry's capability to maintain the pace of technology progression required by Moore's law.","PeriodicalId":267124,"journal":{"name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","volume":"89 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Will reliability limit Moore's law?\",\"authors\":\"A. Oates\",\"doi\":\"10.1109/IEDM.2014.7047092\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. Moore's law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore's law. In this talk we will discuss reliability issues that can most directly impact the industry's capability to maintain the pace of technology progression required by Moore's law.\",\"PeriodicalId\":267124,\"journal\":{\"name\":\"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"89 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEDM.2014.7047092\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.2014.7047092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Summary form only given. Moore's law continues to the engine of growth for the global electronics industry. The understanding of IC degradation mechanisms has resulted in rapid reliability improvements that have enabled the rapid rate technology progression we have experienced. Going forward it is clear that the reliability margins the industry has enjoyed in the past will shrink. The question is now whether reliability will pose a constraint on Moore's law. In this talk we will discuss reliability issues that can most directly impact the industry's capability to maintain the pace of technology progression required by Moore's law.