微波模块的ESD失效分析

Zhimin Ding, Chao Duan, Xiaoqing Wang, Zhaoxi Wu, Yang Tian, Meng Meng
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引用次数: 2

摘要

本文证实了静电放电是微波模块失效的原因。通过对某微波模块的失效案例进行了一系列的失效分析、仿真试验和理论分析,得出了上述结论。为了保证微波性能,在微波模块的生产和使用过程中没有设计静电保护电路,从而使静电放电成为微波模块失效的主要原因之一。本文分析了静电放电对微波模块的危害特点,并通过验证试验提出了一种改进方法。即在电路周围增加静电防护措施。本案例为今后微波模组在生产和应用过程中预防和控制静电放电危害提供了参考和依据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Failure Analysis of Microwave Module by ESD Effect
In this paper, it is confirmed that the electrostatic discharge is the cause of failure of the microwave module. The confirmation is based on a series of failure analysis, simulation tests as well as theoretical analysis on the failure case of a microwave module. In order to ensure the microwave performance, no electrostatic protection circuit was designed during the production and application of microwave modules, thus making the electrostatic discharge one of the main reasons for microwave module failure. In this paper, the characteristics of the harm of ESD toward microwave module are analyzed and an improved method is proposed through verification test. That is to add electrostatic protection measures around the circuit. This case provides reference and basis for prevention and control of electrostatic discharge hazards during production and application of microwave modules in the future.
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