{"title":"超低成本模拟BIST使用频谱分析","authors":"M. Negreiros, L. Carro, A. Susin","doi":"10.1109/VTEST.2003.1197636","DOIUrl":null,"url":null,"abstract":"In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.","PeriodicalId":292996,"journal":{"name":"Proceedings. 21st VLSI Test Symposium, 2003.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Ultra low cost analog BIST using spectral analysis\",\"authors\":\"M. Negreiros, L. Carro, A. Susin\",\"doi\":\"10.1109/VTEST.2003.1197636\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.\",\"PeriodicalId\":292996,\"journal\":{\"name\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 21st VLSI Test Symposium, 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.2003.1197636\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 21st VLSI Test Symposium, 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.2003.1197636","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ultra low cost analog BIST using spectral analysis
In this work, a low cost method to implement an analog BIST scheme for the system on chip environment is presented. The method is based on spectral analysis and it is entirely digital. A simple and low cost 1-bit digitizer is used to capture analog information without the need for an AD converter or oversampling techniques. It also allows partitioning of the analog circuit for test thanks to the low analog area overhead of the digitizer. The mathematical framework and a test example are presented, with practical results illustrating limitations and advantages of the proposed technique.