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引用次数: 47
摘要
本文解决了用于保护各种存储器的单纠错双检错码(SEC-DED码)的三比特误码纠错最小化问题。导出了广泛使用的奇权列码的三比特误码纠错的下界,并给出了与该理论下界非常接近的实际码。令人惊讶的是,缩短广义汉明码得到了明显更好的结果。确定了具有32个信息位和7个控制位的最优(39,32)-SEC-DED码,该码在任何可能的线性(39,32)码中具有最低的三比特纠错风险。它显示了具有64位和128位信息位的代码如何比当前使用的代码具有明显更低的三比特纠错概率,可以从该代码派生。新代码还具有相邻的双比特纠错功能(sec - ed - daec代码)。与已知的最佳代码相比,在sec - ed - daec检查器中使用它们可将错误纠正非相邻双比特错误的风险降低27-34%。
New Linear SEC-DED Codes with Reduced Triple Bit Error Miscorrection Probability
This paper solves the problem of minimizing triple bit error miscorrection for single-error-correcting, double-error-detecting codes (SEC-DED codes) which are used to protect all kinds of memory against errors. A lower bound for triple bit error miscorrection for the widely used class of odd-weight column codes is derived and actual codes which are very close to that theoretical bound are presented. Surprisingly, significantly better results are obtained with shortened generalized Hamming codes. An optimal (39,32)-SEC-DED code with 32 information bits and 7 control bits is determined which has the lowest risk of triple bit miscorrection of any possible linear (39,32)-code. It is shown how codes with 64 and 128 information bits with significantly lower triple bit miscorrection probability than currently used codes can be derived from that code.The new codes also feature adjacent double bit error correction capabilities (SEC-DED-DAEC codes). Employing them in a SEC-DED-DAEC checker reduces the risk of miscorrecting non-adjacent double bit errors by 27-34% compared to the best codes known.