B. Mohamad, C. L. Royer, F. Rigaud-Minet, C. Piotrowicz, P. F. Paes Pinto Rocha, C. Leurquin, W. Vandendaele, R. Escoffier, J. Buckley, S. Bécu, J. Biscarrat, R. Gwoziecki
{"title":"电源应用的嵌入式MOS-HEMT技术的深刻见解","authors":"B. Mohamad, C. L. Royer, F. Rigaud-Minet, C. Piotrowicz, P. F. Paes Pinto Rocha, C. Leurquin, W. Vandendaele, R. Escoffier, J. Buckley, S. Bécu, J. Biscarrat, R. Gwoziecki","doi":"10.1109/EDTM55494.2023.10102971","DOIUrl":null,"url":null,"abstract":"In this paper, we present a general overview of AIGaN/GaN MOS channel High Electron Mobility Transistor (HEMTs) with fully recessed gate architecture fabricated on 200mm Si-wafer. Specifically, an insight on its benefits compared to market competitors is brought out respectively from transistor electrical characteristics to robustness behavioral aspects.","PeriodicalId":418413,"journal":{"name":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","volume":"204 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Deep Insights into Recessed Gate MOS-HEMT Technology for Power Applications\",\"authors\":\"B. Mohamad, C. L. Royer, F. Rigaud-Minet, C. Piotrowicz, P. F. Paes Pinto Rocha, C. Leurquin, W. Vandendaele, R. Escoffier, J. Buckley, S. Bécu, J. Biscarrat, R. Gwoziecki\",\"doi\":\"10.1109/EDTM55494.2023.10102971\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a general overview of AIGaN/GaN MOS channel High Electron Mobility Transistor (HEMTs) with fully recessed gate architecture fabricated on 200mm Si-wafer. Specifically, an insight on its benefits compared to market competitors is brought out respectively from transistor electrical characteristics to robustness behavioral aspects.\",\"PeriodicalId\":418413,\"journal\":{\"name\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"volume\":\"204 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDTM55494.2023.10102971\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDTM55494.2023.10102971","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Deep Insights into Recessed Gate MOS-HEMT Technology for Power Applications
In this paper, we present a general overview of AIGaN/GaN MOS channel High Electron Mobility Transistor (HEMTs) with fully recessed gate architecture fabricated on 200mm Si-wafer. Specifically, an insight on its benefits compared to market competitors is brought out respectively from transistor electrical characteristics to robustness behavioral aspects.