GaAs非球面SILs的设计与制造

Ikuo Arata, H. Terada, M. Vervaeke, D. Rosseel, H. Thienpont
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引用次数: 0

摘要

固体浸没透镜(SIL)是半导体失效分析不可或缺的工具。通过增加物镜的数值孔径(NA),可以显著提高光学分辨率极限。通常SILs是由硅制成的,因为半导体晶片材料由硅组成。硅具有非常高的折射率(约3.5),它使分辨率极限比普通透镜高3.5倍。但是,最近尖端设备的技术节点对于Si-SILs来说太小了。为了克服分辨率问题,短波长激光器被引入以获得更高的分辨率。[1],[2],[3]遗憾的是,Si仅在波长超过1100nm时是透明的。另一方面,GaAs和GaP在比Si更短的波长下是透明的,而它们的折射率与Si相当。然而,设计和制造非球面SIL是必要的,除非为SIL重新设计和优化了支撑目标。我们设计并制造了一种非球面GaAs-SIL,并在使用无像差校正的背衬物镜时证明了衍射限制光学成像质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and Manufacturing of GaAs Aspherical SILs
A solid immersion lens (SIL) is an indispensable tool for semiconductor failure analysis. SILs can dramatically enhance the optical resolution limit by increasing the numerical aperture (NA) of the objective lens. Normally SILs are made of Si because the semiconductor wafer material consists of Si. Si has a very high refractive index (about 3.5) and it makes the resolution limit 3.5 times higher than that of normal lenses. However, recently the technology node of cutting-edge devices became too small for Si-SILs. To overcome the resolution problem, short wavelength lasers have been introduced to get a higher resolution.[1], [2], [3] Unfortunately Si is only transparent for wavelengths longer than 1100nm. GaAs and GaP on the other hand are transparent at shorter wavelengths than Si, while their refractive index is equivalent to that of Si. Designing and manufacturing aspherically shaped SILs is however needed to make it possible to use these materials as SILs, unless the backing objective is redesigned and optimized for the SIL. We have designed and manufactured a GaAs-SIL with aspherical shape and demonstrated diffraction limited optical imaging quality while using a backing objective lens with no aberration correction.
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