{"title":"柯克效应在高压集成电路中的限制","authors":"A. Ludikhuize","doi":"10.1109/ISPSD.1994.583734","DOIUrl":null,"url":null,"abstract":"The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC's is observed to decrease at high current density. This is attributed to the Kirk effect.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"86","resultStr":"{\"title\":\"Kirk effect limitations in high voltage IC's\",\"authors\":\"A. Ludikhuize\",\"doi\":\"10.1109/ISPSD.1994.583734\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC's is observed to decrease at high current density. This is attributed to the Kirk effect.\",\"PeriodicalId\":405897,\"journal\":{\"name\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"86\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1994.583734\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583734","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The voltage handling capability of Resurf LDMOS and of junction isolated islands in HV IC's is observed to decrease at high current density. This is attributed to the Kirk effect.