可靠性与产量之间的权衡，以减少“无故障”的现场退货

2015 IEEE 21st International On-Line Testing Symposium (IOLTS) Pub Date : 2015-07-06 DOI:10.1109/IOLTS.2015.7229854

A. Haggag, N. Sumikawa, Aamer Shaukat

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引用次数: 6

摘要

随着VLSI规模的扩大，由于软缺陷比硬缺陷占主导地位，“无故障发现”或NTF领域的回报增加了。对网络和DSP NTF现场回报的分析表明，不仅产品参数，而且模内工艺参数的异常行为揭示了新的缓解机会。由此产生的产量影响被证明是较小的50%的油田回报，并且调试成本很高。

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Reliability/yield trade-off in mitigating “no trouble found” field returns

With VLSI scaling, “no trouble found” or NTF field returns have increased due to the dominance of soft defects over hard defects. An analysis of networking and DSP NTF field returns shows outlying behavior in not only product parameters but also on-die process parameters revealing new mitigation opportunities. The resulting yield hit is demonstrated to be minor <;0.5% to catch NTFs that can be >50% field returns with high debug cost.

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2015 IEEE 21st International On-Line Testing Symposium (IOLTS)

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