新兴负电容晶体管技术中缓解功率侧通道攻击的新方法

Shubham Kumar, Swetaki Chatterjee, Chetan Kumar Dabhi, H. Amrouch, Y. Singh Chauhan
{"title":"新兴负电容晶体管技术中缓解功率侧通道攻击的新方法","authors":"Shubham Kumar, Swetaki Chatterjee, Chetan Kumar Dabhi, H. Amrouch, Y. Singh Chauhan","doi":"10.1109/NEWCAS52662.2022.9842186","DOIUrl":null,"url":null,"abstract":"Power side-channel (PSC) attacks have recently gained popularity in breaking into cyber-physical systems due to their non-invasiveness and proven effectiveness. In the CMOS circuit, the power dissipation when output transitions from ‘0' to ‘1' is different compared to the transition from ‘1' to ‘0'. The difference in power consumption results in input-dependent correlation, used for PSC to infer secret keys. This is the first work to investigate the impact of PSC on NCFET at the device level. We demonstrate using Gate Work Function engineering to mitigate PSC attacks effectively for the first time.","PeriodicalId":198335,"journal":{"name":"2022 20th IEEE Interregional NEWCAS Conference (NEWCAS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology\",\"authors\":\"Shubham Kumar, Swetaki Chatterjee, Chetan Kumar Dabhi, H. Amrouch, Y. Singh Chauhan\",\"doi\":\"10.1109/NEWCAS52662.2022.9842186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power side-channel (PSC) attacks have recently gained popularity in breaking into cyber-physical systems due to their non-invasiveness and proven effectiveness. In the CMOS circuit, the power dissipation when output transitions from ‘0' to ‘1' is different compared to the transition from ‘1' to ‘0'. The difference in power consumption results in input-dependent correlation, used for PSC to infer secret keys. This is the first work to investigate the impact of PSC on NCFET at the device level. We demonstrate using Gate Work Function engineering to mitigate PSC attacks effectively for the first time.\",\"PeriodicalId\":198335,\"journal\":{\"name\":\"2022 20th IEEE Interregional NEWCAS Conference (NEWCAS)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 20th IEEE Interregional NEWCAS Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS52662.2022.9842186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 20th IEEE Interregional NEWCAS Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS52662.2022.9842186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

功率侧信道(PSC)攻击由于其非侵入性和已被证明的有效性,最近在入侵网络物理系统方面越来越受欢迎。在CMOS电路中,输出从“0”到“1”时的功耗与输出从“1”到“0”时的功耗不同。功耗的差异导致输入相关,用于PSC推断密钥。这是第一次在器件水平上研究PSC对NCFET的影响。我们首次演示了使用门功函数工程来有效地减轻PSC攻击。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology
Power side-channel (PSC) attacks have recently gained popularity in breaking into cyber-physical systems due to their non-invasiveness and proven effectiveness. In the CMOS circuit, the power dissipation when output transitions from ‘0' to ‘1' is different compared to the transition from ‘1' to ‘0'. The difference in power consumption results in input-dependent correlation, used for PSC to infer secret keys. This is the first work to investigate the impact of PSC on NCFET at the device level. We demonstrate using Gate Work Function engineering to mitigate PSC attacks effectively for the first time.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信