Measurement and analysis for stripline material parameters using network analyzers

The characterization of material parameters for dielectrics used in the construction of stripline and related structures is presented. The measured scattering parameters of transmission line samples are used to predict the material parameters of the line. The corresponding measurements have been performed using a Hewlett-Packard 8510B network analyzer using the 'thru-reflect-line' calibration technique. A review is presented of the calibration process, the fixture used to mount the samples, the structure of the transmission line sample, and the frequency-domain model for the stripline structure along with the optimization program used to implement the curve fit of the model to the measured data. The measurements are used to predict the value of dielectric constant and loss tangent of materials common in thick and thin film structures. Excellent results have been obtained for the dielectric constant and loss tangent of several materials.<>