65纳米嵌入式汽车应用的高性能闪存

F. Piazza, C. Boccaccio, S. Bruyère, Riccardo Cea, Bill Clark, N. Degors, Christopher N. Collins, A. Gandolfo, A. Gilardini, E. Gomiero, Pierre-Marie Mans, G. Mastracchio, D. Pacelli, N. Planes, J. Simon, M. Weybright, A. Maurelli
{"title":"65纳米嵌入式汽车应用的高性能闪存","authors":"F. Piazza, C. Boccaccio, S. Bruyère, Riccardo Cea, Bill Clark, N. Degors, Christopher N. Collins, A. Gandolfo, A. Gilardini, E. Gomiero, Pierre-Marie Mans, G. Mastracchio, D. Pacelli, N. Planes, J. Simon, M. Weybright, A. Maurelli","doi":"10.1109/IMW.2010.5488312","DOIUrl":null,"url":null,"abstract":"In this paper the results obtained for a new process flow that integrates a high performance flash cell for automotive application with a state of the art 65nm CMOS have been presented. Despite the several specific process steps introduced for the first time on embedded technologies, the MOS performances have not been impacted by the integration of the Flash cell and the related HV MOS and the results obtained on a 4Mbit Flash array are very promising.","PeriodicalId":149628,"journal":{"name":"2010 IEEE International Memory Workshop","volume":"262 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"High performance Flash memory for 65 nm embedded automotive application\",\"authors\":\"F. Piazza, C. Boccaccio, S. Bruyère, Riccardo Cea, Bill Clark, N. Degors, Christopher N. Collins, A. Gandolfo, A. Gilardini, E. Gomiero, Pierre-Marie Mans, G. Mastracchio, D. Pacelli, N. Planes, J. Simon, M. Weybright, A. Maurelli\",\"doi\":\"10.1109/IMW.2010.5488312\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the results obtained for a new process flow that integrates a high performance flash cell for automotive application with a state of the art 65nm CMOS have been presented. Despite the several specific process steps introduced for the first time on embedded technologies, the MOS performances have not been impacted by the integration of the Flash cell and the related HV MOS and the results obtained on a 4Mbit Flash array are very promising.\",\"PeriodicalId\":149628,\"journal\":{\"name\":\"2010 IEEE International Memory Workshop\",\"volume\":\"262 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Memory Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMW.2010.5488312\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Memory Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2010.5488312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

摘要

本文介绍了一种新的工艺流程的结果,该流程将高性能汽车闪存单元与最先进的65nm CMOS集成在一起。尽管在嵌入式技术中首次引入了几个具体的工艺步骤,但Flash单元与相关HV MOS的集成并未影响MOS的性能,并且在4Mbit闪存阵列上获得的结果非常有希望。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High performance Flash memory for 65 nm embedded automotive application
In this paper the results obtained for a new process flow that integrates a high performance flash cell for automotive application with a state of the art 65nm CMOS have been presented. Despite the several specific process steps introduced for the first time on embedded technologies, the MOS performances have not been impacted by the integration of the Flash cell and the related HV MOS and the results obtained on a 4Mbit Flash array are very promising.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信