{"title":"利用拉曼微探针对薄膜进行二维和三维成像","authors":"P. Fauchet","doi":"10.1364/lmd.1987.wa1","DOIUrl":null,"url":null,"abstract":"There is an increasing need for non-destructive characterization techniques that require no special sample preparation, can be used in-situ, and provide quantitative information with good spatial resolution. The Raman microprobe fulfills these requirements. We illustrate the capabilities of the Raman microprobe by presenting results obtained on thin films after laser-induced damage, after laser or rapid thermal annealing, and on heteroepitaxial semiconductor layers. The prospects for two and three-dimensional imaging of important properties such as composition, strain, and crystalline quality or orientation are discussed.","PeriodicalId":331014,"journal":{"name":"Topical Meeting on Lasers in Materials Diagnostics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Two and Three Dimensional Imaging of Thin Films Using the Raman Microprobe\",\"authors\":\"P. Fauchet\",\"doi\":\"10.1364/lmd.1987.wa1\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"There is an increasing need for non-destructive characterization techniques that require no special sample preparation, can be used in-situ, and provide quantitative information with good spatial resolution. The Raman microprobe fulfills these requirements. We illustrate the capabilities of the Raman microprobe by presenting results obtained on thin films after laser-induced damage, after laser or rapid thermal annealing, and on heteroepitaxial semiconductor layers. The prospects for two and three-dimensional imaging of important properties such as composition, strain, and crystalline quality or orientation are discussed.\",\"PeriodicalId\":331014,\"journal\":{\"name\":\"Topical Meeting on Lasers in Materials Diagnostics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Lasers in Materials Diagnostics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/lmd.1987.wa1\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Lasers in Materials Diagnostics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/lmd.1987.wa1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Two and Three Dimensional Imaging of Thin Films Using the Raman Microprobe
There is an increasing need for non-destructive characterization techniques that require no special sample preparation, can be used in-situ, and provide quantitative information with good spatial resolution. The Raman microprobe fulfills these requirements. We illustrate the capabilities of the Raman microprobe by presenting results obtained on thin films after laser-induced damage, after laser or rapid thermal annealing, and on heteroepitaxial semiconductor layers. The prospects for two and three-dimensional imaging of important properties such as composition, strain, and crystalline quality or orientation are discussed.