{"title":"角点批号鉴定技术","authors":"J. Gagnon, D. Potts, S.C. Park, R. Whitcomb","doi":"10.1109/IRWS.1995.493571","DOIUrl":null,"url":null,"abstract":"This paper describes a new approach in the sample make up for qualifying a new process, a process change, and, or a material change. This new approach, which we will refer to as the corner point lot method, produces a qualification sample that better represents the process operating window. The corner point lot method uses a design of experiment approach to purposely force critical parameters, as identified through Failure Mode and Effect Analysis (FMEA), to the corners of their spec limits.","PeriodicalId":355898,"journal":{"name":"IEEE 1995 International Integrated Reliability Workshop. Final Report","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Corner point lot qualification technique\",\"authors\":\"J. Gagnon, D. Potts, S.C. Park, R. Whitcomb\",\"doi\":\"10.1109/IRWS.1995.493571\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes a new approach in the sample make up for qualifying a new process, a process change, and, or a material change. This new approach, which we will refer to as the corner point lot method, produces a qualification sample that better represents the process operating window. The corner point lot method uses a design of experiment approach to purposely force critical parameters, as identified through Failure Mode and Effect Analysis (FMEA), to the corners of their spec limits.\",\"PeriodicalId\":355898,\"journal\":{\"name\":\"IEEE 1995 International Integrated Reliability Workshop. Final Report\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1995 International Integrated Reliability Workshop. Final Report\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRWS.1995.493571\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1995 International Integrated Reliability Workshop. Final Report","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRWS.1995.493571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes a new approach in the sample make up for qualifying a new process, a process change, and, or a material change. This new approach, which we will refer to as the corner point lot method, produces a qualification sample that better represents the process operating window. The corner point lot method uses a design of experiment approach to purposely force critical parameters, as identified through Failure Mode and Effect Analysis (FMEA), to the corners of their spec limits.
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