使用MOS PTAT的低功耗CMOS片上电压基准:一种EP方法

Yoon-Deuk Seo, D. Nam, Byoung-Jin Yoon, I. Choi, Beomsup Kim
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引用次数: 9

摘要

本文提出了一种新的低功耗片上电压基准,对0.5 /spl mu/m DRAM工艺变化不敏感,既没有可靠的BJT,也没有耗尽MOS。所提出的基准电压使用MOS阈值电压和仅由MOS晶体管产生的PTAT(与绝对温度成正比)电压,并且在外部电源电压范围为2.8至4 V的情况下,在总电流小于8 /spl mu/ a的情况下获得相当好的性能。在0/spl℃至100/spl℃的温度范围内,测量的温度系数约为360 ppm//spl℃。此外,还提出了一种优化技术,在电路设计中找到一组最优参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Low-power CMOS on-chip voltage reference using MOS PTAT: an EP approach
This paper presents a new low-power on-chip voltage reference less sensitive to the process variation in an 0.5 /spl mu/m DRAM process where neither reliable BJT nor depletion MOS are available. The proposed voltage reference uses the MOS threshold voltage and a PTAT (proportional to the absolute temperature) voltage generated only from MOS transistors, and achieves considerably good performance at the total current of less than 8 /spl mu/A with an external power supply voltage ranging from 2.8 to 4 V. The measured temperature coefficient is about 360 ppm//spl deg/C at temperatures ranging from 0/spl deg/C to 100/spl deg/C. In addition, an optimization technique is proposed to find a set of optimal parameters in designing circuits.
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