一种考虑NBTI效应和工艺变化的减小时钟偏差的新流程

Jifeng Chen, M. Tehranipoor
{"title":"一种考虑NBTI效应和工艺变化的减小时钟偏差的新流程","authors":"Jifeng Chen, M. Tehranipoor","doi":"10.1109/ISQED.2013.6523630","DOIUrl":null,"url":null,"abstract":"Negative bias temperature instability (NBTI) has emerged as a major concern not only to the functional circuits, but also to the clock tree. Further aggravated by process variations, aging-induced reliability issue becomes more challenging when technology further scales. Development of effective solutions for reducing clock skew and compensating aging effect under process variations remains as a challenge. Taking the impact from NBTI and process variations into account, we propose a novel flow for reducing clock skew by selectively replacing standard-Vth clock buffers with their high-Vth counterparts. An extended “divide and conquer” algorithm is developed to identify the critical clock buffers for replacement. The area overhead of our proposed flow is negligible, and the power consumption is reduced as well. Simulation results show that the proposed flow can effectively reduce the clock skew by at least 20% by replacing only 1.08% clock buffers on average for 10 years of degradation, even under an extremely constrained condition. The efficiency of our flow will be higher when the clock tree structure has a higher depth, rendering it more favorable for large-scale industry designs.","PeriodicalId":127115,"journal":{"name":"International Symposium on Quality Electronic Design (ISQED)","volume":"23 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A novel flow for reducing clock skew considering NBTI effect and process variations\",\"authors\":\"Jifeng Chen, M. Tehranipoor\",\"doi\":\"10.1109/ISQED.2013.6523630\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Negative bias temperature instability (NBTI) has emerged as a major concern not only to the functional circuits, but also to the clock tree. Further aggravated by process variations, aging-induced reliability issue becomes more challenging when technology further scales. Development of effective solutions for reducing clock skew and compensating aging effect under process variations remains as a challenge. Taking the impact from NBTI and process variations into account, we propose a novel flow for reducing clock skew by selectively replacing standard-Vth clock buffers with their high-Vth counterparts. An extended “divide and conquer” algorithm is developed to identify the critical clock buffers for replacement. The area overhead of our proposed flow is negligible, and the power consumption is reduced as well. Simulation results show that the proposed flow can effectively reduce the clock skew by at least 20% by replacing only 1.08% clock buffers on average for 10 years of degradation, even under an extremely constrained condition. The efficiency of our flow will be higher when the clock tree structure has a higher depth, rendering it more favorable for large-scale industry designs.\",\"PeriodicalId\":127115,\"journal\":{\"name\":\"International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"23 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-03-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2013.6523630\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2013.6523630","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

负偏置温度不稳定性(NBTI)已成为功能电路和时钟树关注的主要问题。随着技术的进一步发展,工艺变化进一步加剧了老化引起的可靠性问题。开发有效的解决方案来减少时钟偏差和补偿工艺变化下的老化效应仍然是一个挑战。考虑到NBTI和过程变化的影响,我们提出了一种新的流程,通过选择性地用高v值时钟缓冲替换标准v值时钟缓冲来减少时钟倾斜。开发了一种扩展的“分而治之”算法来识别需要替换的关键时钟缓冲区。我们提出的流的面积开销可以忽略不计,并且功耗也降低了。仿真结果表明,即使在极端约束条件下,该流在10年的退化时间内平均仅更换1.08%的时钟缓冲区,也能有效地减少至少20%的时钟偏差。时钟树结构深度越深,我们的流程效率越高,更有利于大规模的工业设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A novel flow for reducing clock skew considering NBTI effect and process variations
Negative bias temperature instability (NBTI) has emerged as a major concern not only to the functional circuits, but also to the clock tree. Further aggravated by process variations, aging-induced reliability issue becomes more challenging when technology further scales. Development of effective solutions for reducing clock skew and compensating aging effect under process variations remains as a challenge. Taking the impact from NBTI and process variations into account, we propose a novel flow for reducing clock skew by selectively replacing standard-Vth clock buffers with their high-Vth counterparts. An extended “divide and conquer” algorithm is developed to identify the critical clock buffers for replacement. The area overhead of our proposed flow is negligible, and the power consumption is reduced as well. Simulation results show that the proposed flow can effectively reduce the clock skew by at least 20% by replacing only 1.08% clock buffers on average for 10 years of degradation, even under an extremely constrained condition. The efficiency of our flow will be higher when the clock tree structure has a higher depth, rendering it more favorable for large-scale industry designs.
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